The MPI TS200-SE probe system incorporates the ShieldEnvironment™ providing optimal EMI shielding which allows ultra-low noise device on-wafer measurements for many applications such as Device Characterization and Modeling, RF & Microwave, Failure Analysis, Design Validation, and High Power up to 200mm wafer size.
The modular design concept of all MPI manual probe systems allows a unique upgrade path towards the reduced cost of ownership.
[/vc_column_text][/vc_column][/vc_row][vc_row][vc_column width=”1/3″][vc_custom_heading text=”TS150″ font_container=”tag:h2|text_align:center”][vc_single_image image=”100″ alignment=”center”][/vc_column][vc_column width=”1/3″][vc_custom_heading text=”TS200″ font_container=”tag:h2|text_align:center”][vc_single_image image=”101″ alignment=”center”][/vc_column][vc_column width=”1/3″][vc_custom_heading text=”TS300″ font_container=”tag:h2|text_align:center”][vc_single_image image=”102″ alignment=”center”][/vc_column][/vc_row][vc_row][vc_column width=”1/2″][vc_custom_heading text=”TS150-THZ” font_container=”tag:h2|text_align:center”][vc_single_image image=”103″ alignment=”center”][/vc_column][vc_column width=”1/2″][vc_custom_heading text=”TS200-SE” font_container=”tag:h2|text_align:center”][vc_single_image image=”104″ alignment=”center”][/vc_column][/vc_row][vc_row][vc_column][vc_custom_heading text=”MPI Automated Probe Systems” font_container=”tag:h2|text_align:center”][vc_separator][vc_custom_heading text=”Main Applications”][vc_column_text]
MPI is proud to announce its new 200mm automated probe system, dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis,Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
[/vc_column_text][/vc_column][/vc_row][vc_row][vc_column][vc_custom_heading text=”Whats New”][vc_column_text]The new Advanced Semiconductor Test engineering probe systems incorporate the same hardware controller as the well-established, market leading LED Test probe systems that has global installed base of more than 9000 systems. Time tested and proven in demanding 24/7 operations, MPI is now introducing such capabilities and systems reliability into the Engineering Market.The TS2000 is the probe system which can be configured with ambient to hot chucks up to 300°C. The TS2000-SE is the advanced probe system equipped with automated single wafer loader and can be configured at extended temperature ranges from -60°C to +300°C. The SE stands for MPI ShielDEnvironment™ – a local environment chamber providing an excellent EMI- and light-tight shielding for ultra-low noise measurements.
[/vc_column_text][/vc_column][/vc_row][vc_row][vc_column width=”1/2″][vc_custom_heading text=”TS2000″ font_container=”tag:h2|text_align:center”][vc_single_image image=”106″ alignment=”center”][/vc_column][vc_column width=”1/2″][vc_custom_heading text=”TS2000-SE” font_container=”tag:h2|text_align:center”][vc_single_image image=”107″ alignment=”center”][/vc_column][/vc_row]